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Examinator Production
Device Production, Correlation Analysis, Yield Optimization
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Advanced Analysis for Production and Yield Optimization |
Examinator-Production is database powered and is ideal for
yield optimization, advanced analysis and any high volume production
semiconductor test data analysis. Simply import all your data
files into the Examinator - Production built-in database and
run your queries! It is the most efficient way to correlate
any type of parameter, or perform sharp analysis on large amount
of data.
Target Usage: Examinator-Production is the ideal companion for:
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Production and high volume data analysis |
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Yield optimization missions |
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Correlation over processes (e.g.: wafer fab and test) |
Features:
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Ultra fast and very cost effective, turning semiconductor
data into HTML reports. |
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Built on the world-leading Examinator technology leveraging
a database powered repository for easy queries over
large datasets!
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Embedded XML database automatically handles the administration
tasks that you don't want to be bothered with! It's been
designed to work silently so you can focus on only what
matters: your data analysis. Using our optional database
plug-in, you can also connect to any Oracle or mySQL databases! |
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XML indexed makes it fully cross-platform binary compatible
(PC, Unix, Linux, etc) and allows as many data files as
your disks can handle! |
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Unlimited number of database folders (typically use
one database folder per data collection type. E.g.: wafer
probe, final test, purchase orders, etc) |
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Data import links makes the database only hold the links
to your semiconductor data files and therefore save significant
disk space as the data are not duplicated into the database
structure. This also significantly boosts the data import
process...a very convenient option! |
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Queries can be executed on any database folder letting
you correlate any parameter! |
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Administrative control allows password protection of
database actions (import data , delete database) |
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Indepth Data Analysis including:
Box plots, pareto reports on test failures, Cpk, binning
, yield reports, Cp, Cpk, mean, range, standard deviation,
failure count, binning results, test time reports, raw
data (pass, fail, or range of tests), and much more! |
Key Benefits:
Datatype & Application Support:
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ATE Testers
Advantest, Agilent, Credence / SZ, LTX, NPTest, Teradyne,
etc. |
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Semiconductor data files
E-Test, STDF V3, STDF V4, ATDF, WAT, PCM Foundry data |
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Bench & Simulation Data
ASCII files, Excel, CSV files
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Platforms:
More Information:
Related Products:
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