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Examinator Production
Device Production, Correlation Analysis, Yield Optimization
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Advanced Analysis for Production and Yield Optimization |
Examinator-Production is database powered and is ideal for yield optimization,
advanced analysis and any high volume production semiconductor test data
analysis. Simply import all your data files into the Examinator - Production
built-in database and run your queries! It is the most efficient way to
correlate any type of parameter, or perform sharp analysis on large amount
of data.
Target Usage:
Examinator-Production is the ideal companion for:
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Production and high volume data analysis |
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Yield optimization missions |
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Correlation over processes (e.g.: wafer fab and test) |
Features:
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Ultra fast and very cost effective, turning semiconductor data into
HTML reports. |
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Built on the world-leading Examinator technology leveraging a database
powered repository for easy queries over large datasets!
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Embedded XML database automatically handles the administration tasks
that you don't want to be bothered with! It's been designed to work
silently so you can focus on only what matters: your data analysis.
Using our optional database plug-in, you can also connect to any Oracle
or mySQL databases! |
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XML indexed makes it fully cross-platform binary compatible (PC,
Unix, Linux, etc) and allows as many data files as your disks can
handle! |
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Unlimited number of database folders (typically use one database
folder per data collection type. E.g.: wafer probe, final test, purchase
orders, etc) |
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Data import links makes the database only hold the links to your
semiconductor data files and therefore save significant disk space
as the data are not duplicated into the database structure. This also
significantly boosts the data import process...a very convenient option! |
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Queries can be executed on any database folder letting you correlate
any parameter! |
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Administrative control allows password protection of database actions
(import data , delete database) |
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Indepth Data Analysis including:
Box plots, pareto reports on test failures, Cpk, binning , yield reports,
Cp, Cpk, mean, range, standard deviation, failure count, binning results,
test time reports, raw data (pass, fail, or range of tests), and much
more! |
Key Benefits:
Datatype & Application Support:
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ATE Testers
Advantest, Agilent, Credence / SZ, LTX, NPTest, Teradyne, etc. |
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Semiconductor data files
E-Test, STDF V3, STDF V4, ATDF, WAT, PCM Foundry data |
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Bench & Simulation Data
ASCII files, Excel, CSV files
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Platforms:
More Information:
Related Products:
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