Examinator Characterization
Device and Test Program Characterization, Correlation Analysis

Next Step Download Software Request for Quotation Highlights Best-in-Class Technology Fast, Comprehensive, & Intuitive Analysis #1 in Price/Performance!

Simple and Effective Correlation, Data, and Yield Analysis
Examinator-Characterization is a fast and very cost effective solution designed for easy semiconductor test data analysis and reporting. Examinator's unique highly intuitive interface makes any semiconductor data analysis, yield analysis and correlation mission a snap.

Examinator is designed from the ground-up using the latest standard technologies (Web interface, HTML and Excel/CSV reports, cross-platform support, network aware), it doesn't suffer from any legacy compromise. Examinator naturally and seamlessly integrates into your work flow, and gives you immediate returns. Significant productivity increase and cost savings are seen when standardizing on Examinator as no training is required: any new user masters the solutions in minutes!

Target Usage: Examinator-Characterization is ideal for: Device and test program characterization Correlation Analysis Features: Blazing speed. Typically 80% of engineer's time in data analysis is spent collecting and processing data, Examinator's blazing speed makes a huge difference. Spend your time resolving root causes.

Test statistics tables

	Universal viewer and reader - Reads all your semiconductor data, builds reports in HTML so they can be viewed from any computer using its web browser!
	One click, one report. Report creation is just 1 click away. There are no overwhelming menus and options and complexity is hidden from the user interface.
	Direct link to Word and PowerPoint. A single click sends any Examinator report to your favorite application! Creating PowerPoint™ slides or Word documents is a snap
	No database repository required
	No data size limit. Smart Import... makes large production analysis a snap (calendar selection, filters on lot name, testers, etc...)
	Comprehensive and Intuitive Reporting - Test statistics tables - Drill into the data, find suspicious tests... play "what-if" scenario (edit limits and see impact on Cp, Cpk, Yield) - Histograms charts – Quickly confirm which tests are linked to process drifts - Pareto charts – Consult Pareto reports and investigate root causes - Trend charts – Review test results trends - Scatter plots / Correlation analysis - Track correlation patterns - Wafer maps – A picture is worth a 1000 words! Failure counts pareto
	Web Resources Knowledge Center - The Galaxy Web site support section includes all you need to be more productive. Share the knowledge of over 1,000 users!

Key Benefits: Easy to use, you'll find your way in seconds! Efficiency booster using the powerful graphical environment to manipulate test data files directly Test Time optimization via reorder, modify or eliminate tests Convenient report creation to help you make the right decision quickly Build Presentations instantly! Share information, easily integrate your Examinator reports into Word documents, PowerPoint slides, and HTML pages

Trend Chart

	Easy to deploy. No server is required. No database is required. No data file parser is required. Download the software to your computer then run it, it is that simple!
	Cost effective, spend as little as $3 / day or less!
	Examinator is proven with over 1,000 users!

Multi-parameters correlation

Datatype & Application Support:

	ATE Testers Advantest, Agilent, Credence / SZ, LTX, NPTest, Teradyne, etc.
	Semiconductor data files E-Test, STDF V3, STDF V4, ATDF, WAT, PCM Foundry data
	Bench & Simulation Data ASCII files, Excel, CSV files

* Note: Examinator offers full flexibility on the data insertion process as it supports user driven as well as automated data import. It integrates perfectly into any working environment.

Wafer Maps

Platforms:

	Sun Solaris
	HPUX
	Windows

More Information:

Examinator (PDF)

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