TurboBist-Memory Embedded Memory Testing Next Step Download Software Request for Quotation Highlights Best-in-Class Technology Efficient Bist Structures Supports All Embedded Memories #1 in Price/Performance! High Performance Embedded Memory Testing TurboBIST-Memory™ family of products from SynTest Technologies, Inc., includes tools for adding highly efficient BIST structures to all types of embedded memories including SRAMs, ROMs, SDRAMs and CAMs. These tools, part of SynTest's complete suite of testability analysis, scan synthesis, ATPG and fault simulation solutions, automatically synthesize the BIST logic surrounding the memory blocks and generate the test patterns needed to provide very high fault coverage testing of complete complex system-on-chip ICs. A single IEEE 1149.1 compliant TAP controller on the chip can be used to control multiple "BISTed" embedded memory cells of all types, as well as for controlling scan and boundary scan functions,thus keeping silicon overhead to the absolute minimum. SDRAM and CAM BIST are currently available as services from SynTest's Applications Engineering group. SRAM and ROM BIST can be implemented either by using SynTest's service group or by acquiring licenses for the tools for inhouse use. Programmable SRAM BIST is also available as a service. Benefits: Automatically generates classical or user configurable test pattern test Includes March C-, Moving Inversion March, March C++ and Checkerboard Allows simultaneos, multiple BIST memory test via a shared controller Supports embedded SRAMs, ROMs, SDRAMs and CAMs Outputs logic Verilog/VHDL synthesizable RTL code Outputs logic synthesis scripts Generates Verilog/VHDL test bench code automatically to reduce test design time Other Information Platforms: Sun Solaris HP-UX Linux More Information: TurboBist-Memory Datasheet (PDF) Related Products TurboBist-Logic VirtualScan - xtreme compression TurboDebug - SoC and board debug